Measurement and Analysis of a High-Speed TSV Channel

IEEE Transactions on Components, Packaging and Manufacturing Technology(2012)

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摘要
Using high-speed through-silicon via (TSV) channels is a potential means of utilizing 3-D interconnections to realize considerable high-bandwidth throughput in vertically stacked and laterally distributed integrated circuits. However, although the TSV and a silicon interposer in a high-speed TSV channel lead to a significant decrease of the interconnect length, the received digital signal after tr...
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关键词
Through-silicon vias,Vehicles,Loss measurement,Silicon,Frequency domain analysis,Capacitance
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