Monte Carlo simulations for the characterization of position-sensitive x-ray detectors dedicated to Compton polarimetry

We present here a Monte Carlo program based on the EGS5 package for modeling the detector response of position-sensitive x-ray detectors. The program is used to estimate the polarimeter quality of two novel detector systems applied in Compton polarimetry. The validity of the underlying physical models is verified by comparing the simulation output to experimental data obtained at the experimental storage ring, ESR.