Local Retention Behaviors Of Epitaxial And Polycrystalline Pbmg1/3nb2/3o3-Pbtio3 Thin Films By Scanning Force Microscopy

APPLIED PHYSICS LETTERS(2007)

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摘要
The authors report the results of retention in epitaxial and polycrystalline PbMg1/3Nb2/3O3-PbTiO3 (PMN-PT) thin films on SrRuO3 (SRO) and Pt. The SRO electrodes were deposited by pulsed laser deposition and the PMN-PT thin films were coated by a sol-gel method. Local poling behaviors of the PMN-PT domains were investigated as a function of time in both single-poled and reverse-poled regions by scanning force microscopy. An extended exponential decay is observed in the PMN-PT/SRO heterostructures while a fluctuated relaxation is shown in the PMN-PT/Pt films, suggesting that crystal orientation and grain growth is critical to understand retention of relaxor ferroelectrics. (c) 2007 American Institute of Physics.
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关键词
exponential decay,pulsed laser deposition,atomic force microscopy,grain growth,thin film,sol gel method
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