Mechanism and Lifetime Prediction Method for Hot-Carrier-induced Degradation in Lateral Diffused Metal-Oxide-semiconductor TransistorsJone F. Chen,Kuen-Shiuan Tian,Shiang-Yu Chen,J. R. Lee,Kuo-Ming Wu,C. M. LiuApplied physics letters（2008）引用 8|浏览13AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
