High Precision Measurement of Undulator Polarization in the Regime of Hard X-RaysB. Marx,K. S. Schulze,I. Uschmann,T. Kaempfer,O. Wehrhan,H. C. Wille,K. Schlage,R. Roehlsberger,E. Weckert,E. Foerster,T. Stoehlker,G. G. PaulusApplied Physics Letters（2014）引用 2|浏览19AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
