High Resolution Positron-Annihilation Spectroscopy With A New Positron Microprobe

In cooperation with Zeiss/LEO GmbH, a monoenergetic positron source has been integrated in the electron optical system of a scanning electron microscope by help of a magnetic prism, The electron optics serves both to image the specimen with electrons and to form a positron microbeam that allows local positron-annihilation measurements with a resolution in the micron range. The fatigue damage profile along the cross section of a copper plate after a three-point bending test has been investigated. The obtained S-parameter profile coincides well with the expected fatigue damage distribution. (C) 1997 American Institute of Physics.