Strain Evaluation In Alinn/Gan Bragg Mirrors By In Situ Curvature Measurements And Ex Situ X-Ray Grazing Incidence And Transmission Scattering

APPLIED PHYSICS LETTERS(2010)

引用 22|浏览9
暂无评分
摘要
Strain in lattice matched and mismatched AlInN/GaN Bragg mirror structures were studied by in situ curvature and various ex situ x-ray measurements. In the case of lattice mismatched structures considerable deviations of the in-plane lattice parameters were evidenced near the surface region as well as in depth using x-ray grazing incidence and x-ray transmission scattering in Laue geometry. The experimental findings are explained in terms of partial stress relaxation of the AlInN/GaN Bragg layer stack with respect to the underlying GaN buffer and a mutual tensioning of the GaN and AlInN layers with respect to each other. (C) 2010 American Institute of Physics. [doi:10.1063/1.3514241]
更多
查看译文
关键词
distributed bragg reflector,stress relaxation,thin film,lattice parameter,band gap,x ray diffraction,epitaxial growth
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要