Charge Imaging And Manipulation Using Carbon Nanotube Probes

APPLIED PHYSICS LETTERS(2002)

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摘要
Due to their high aspect ratio, well-defined cylindrical structure, and good electrical conductivity, carbon nanotubes (CNTs) are ideal probes for "true" local imaging of electric domain structures at the nanoscale. By performing force-distance measurements and tip-shape profiling with a uniformly charged oxide square, we clearly demonstrate the local nature of the CNT tip for electrostatic force microscopy. We show that CNTs can be used to probe long-range electrostatic forces with a lateral resolution better than 5 nm. (C) 2002 American Institute of Physics.
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关键词
electrostatic force microscopy,atomic force microscope,carbon nanotube,high aspect ratio,electrostatic force,atomic force microscopy,electric conductivity
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