Electron emission in double-electron capture with simultaneous single ionization in 30-keV/uHe2+4-Ar collisions

Physical Review A(2014)

引用 3|浏览51
暂无评分
摘要
Electron emissions are studied for the double-electron capture with simultaneous single ionization process in 30 keV/u He2+-Ar atom collision using the reaction microscope technique. Double-differential cross sections have been obtained for emission angles of 0 degrees, 20 degrees, 45 degrees, 90 degrees, 128 degrees, and 175 degrees and electron energies ranging from 0 to 80 eV. No cusp-shaped electrons centered at a speed equal to that of the incident projectile in the forward direction are observed, which is contrary to the earlier results [D. Fregenal, J. Fiol, G. Bernardi, S. Suarez, P. Focke, A. D. Gonzalez, A. Muthig, T. Jalowy, K. O. Groeneveld, and H. Luna, Phys. Rev. A 62, 012703 (2000)]. An explanation has been provided to clarify the observed results in the current reaction channel.
更多
查看译文
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要