Response model for Kodak Biomax-MS film to x rays

REVIEW OF SCIENTIFIC INSTRUMENTS(2006)

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摘要
X-ray-sensitive film is used for a variety of imaging and spectroscopic diagnostics for high-temperature plasmas. Replacement film must be found as older films are phased out of production. Biomax-MS is a "T-grain" class of film that is proposed as a replacement for Kodak DEF and a model of its response to x rays is presented. Data from dimensional measurements of the film, x-ray transmission measurements, scanning electron microscopy micrograph images, and x-ray calibration are used to develop this sensitivity model of Biomax-MS film as a function of x-ray energy and angle of incidence. Relative response data provide a check of the applicability of this model to determine the x-ray flux from spectrum data. This detailed film characterization starts with simple mathematical models and extends them to T-grain -type film.(c) 2006 American Institute of Physics.
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关键词
spectrum,mathematical model,thin film,scanning electron microscopy,gamma ray spectrometer,x ray spectroscopy,gamma ray,mass spectrometer
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