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J. Troska,V. Bobillier,S. Detraz,S. Papadopoulos,I. Papakonstantinou,S. Storey,C. Sigaud,P. Stejskal,C. Soos,F. Vasey

Journal of Instrumentation（2012）

Cited 18|Views41
Key words
Radiation damage to electronic components,Optical detector readout concepts,Radiation-hard electronics,Front-end electronics for detector readout
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