Temperature dependence of the current generated in Si bulk

JOURNAL OF INSTRUMENTATION(2013)

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摘要
The dependence of the current generated in silicon bulk is investigated both theoretically and experimentally. It is demonstrated to be compatible with I proportional to T(2)e(-1.21eV/2kT) expected for the generation via a level near the middle of the band gap.
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关键词
Si microstrip and pad detectors,Radiation-hard detectors,Particle tracking detectors (Solid-state detectors)
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