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Development of Certified Reference Materials and Methods of Calibration of Small-Angle X-Ray Diffractometers for Certification and Standardization of Articles Produced by Nanoindustry

A. S. Avilov,A. S. Baturin,V. V. Volkov,Yu. A. D’yakova,M. A. Ermakova,A. Yu. Kuzin,M. A. Marchenkova,V. B. Mityukhlyaev,A. Yu. Seregin,S. N. Sul’yanov,E. Yu. Tereshchenko,P. A. Todua

Measurement Techniques（2013）

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关键词
certified reference materials,Langmuir–Blodgett films,small-angle x-ray diffractometers,calibration
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