The XMaS beamline at ESRF: instrumental developments and high-resolution diffraction studies.

S. D. Brown, L. Bouchenoire, D. Bowyer,J. Kervin, D. Laundy, M. J. Longfield,D. Mannix, D. F. Paul,A. Stunault,P. Thompson,M. J. Cooper,C. A. Lucas,W. G. Stirling

JOURNAL OF SYNCHROTRON RADIATION(2001)

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摘要
The beamline, which is situated on a bending magnet at ESRF, comprises a unique combination of instrumentation for high-resolution and magnetic single-crystal diffraction. White-beam operation is possible, as well as focused and unfocused monochromatic modes. In addition to an eleven-axis Huber diffractometer, which facilitates simple operation in both vertical and horizontal scattering geometries, there is an in-vacuum polarisation analyser and slit system, mirrors for harmonic rejection, sub 4.2 K and 1 Tesla magnetic field sample environment, plus a diamond phase plate for polarisation conditioning. The instrumentation developed specifically for this beamline is described, and its use illustrated by recent scientific results.
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关键词
magnetism,diffraction,X-ray instrumentation
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