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An Investigation of Single Event Transient Response in 45-Nm and 32-Nm SOI RF-CMOS Devices and Circuits

Troy D. England,Rajan Arora,Zachary E. Fleetwood,Nelson E. Lourenco,Kurt A. Moen,Adilson S. Cardoso,Dale Mcmorrow,Nicolas J-H. Roche,Jeffery H. Warner,Stephen P. Buchner,Pauline Paki,Akil K. Sutton,Greg Freeman,John D. Cressler

IEEE Transactions on Nuclear Science（2013）

引用 18|浏览1
关键词
Cascode amplifier,RF CMOS,silicon on insulator,single event transient
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