Forecasting of bipolar integrated circuits hardness for various kinds of penetrating radiations

O Dvornikov,V Tchekhovski, V L Diatlov,Yu V Bogatyrev,S B Lastovski

Microwave and Telecommunication Technology（2013）

引用 23|浏览3

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摘要

Experimental equipment for registration of parameters variation of integrated circuits (IC's) which are in operation mode and influenced by a flux of electrons with 4 MeV energy is considered. It's shown possibility of high energy electrons application for forecasting IC hardness to neutron and proton radiation.

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关键词

bipolar integrated circuits,hardness,ic hardness forecasting,bipolar integrated circuits hardness forecasting,electrons flux,experimental equipment,integrated circuit parameters variation registration,penetrating radiations

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