Activities towards a new transient latch-up standard
Electrical Overstress/Electrostatic Discharge Symposium(2013)
摘要
This contribution summarizes the latest Technical Report of the ANSI/ESDA Working Group 5.4 Transient Latch-up (TLU). 18 case studies are described and classified with respect to occurrence of the TLU, trigger, and sensitivity to static latch-up tests. Based on the classification, next steps towards a TLU test methodology are discussed.
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关键词
ansi standards,electrostatic discharge,integrated circuit design,integrated circuit reliability,integrated circuit testing,transients,ansi/esda working group 5.4,tlu,static latch-up tests,technical report,transient latch-up standard
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