K-critical path search based Multi Corner Multi Mode Static Timing Analysis
SoC Design Conference（2014）
摘要
As CMOS technologies are scaled down into the nanometer range, effects of process variation have increased. Finding a critical path is important for performance and optimization of circuit. In this paper, we proposed efficient K-critical path detection in Multi Corner Multi Mode Static Timing Analysis(MCMM STA). We analyzed the characteristic of circuit and used MCMM timing model for considering various corners and modes. Using this timing model and pruning method, we can find more efficiently K-critical paths than traditional STA.
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关键词
cmos integrated circuits,search problems,cmos technologies,mcmm sta,k-critical path search,multicorner multimode static timing analysis,nanometer range,process variation,pruning method,timing model,mcmm,critical path,pruuning method,static timing analysis,lead
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