Advanced Heterojunction Bipolar Transistor for Half-THz SiGe BiCMOS Technology

Electron Device Letters, IEEE(2015)

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摘要
The high-frequency performance of a novel SiGe heterojunction bipolar transistor (HBT) module with monocrystalline base link is investigated in an industrial 0.13- $mu text{m}$ BiCMOS environment. The main feature of this new HBT module is a significant reduction of the external base resistance as shown here by direct comparison with a conventional double-poly-silicon technology. Peak $f_{mathrm { {T}}}/f_{mathrm { {max}}}$ values of 300/500 GHz are achieved. A minimum current-mode logic ring oscillator gate delay of 1.8 ps and a record operation frequency for a SiGe static frequency divider of 161 GHz are demonstrated.
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关键词
heterojunction bipolar transistors (hbts),high-speed devices,ring oscillators,silicon-germanium (sige),logic gates,mimic,epitaxial growth
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