Modeling and Fast Eye Diagram Estimation of Ringing Effects on Branch Line Structures

Components, Packaging and Manufacturing Technology, IEEE Transactions(2014)

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摘要
Significant ringing effects due to multiple reflections are first addressed for the slightly unbalanced address lines in the double data rate memory systems. A resistance-inductance-capacitance resonance model is proposed to explain its occurrence by fitting the transfer function in frequency domain. The transient analysis can then be performed easily and the peak distortion analysis is used to predict its eye height. The cases with the worst signal integrity were identified and a simple design rule is derived to avoid its occurrence, which is dependent on the attenuation constant of the transmission line and the data rate of the signal.
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关键词
rlc circuits,circuit resonance,equivalent circuits,printed circuit design,semiconductor storage,transient analysis,transmission line theory,branch line structures,design rule,double data rate memory system,fast eye diagram estimation,frequency domain,resistance-inductance-capacitance resonance model,ringing effect,signal data rate,slightly unbalanced address lines,transfer function,transmission line,worst signal integrity,address line,branch line,double data rate (ddr),eye diagram,resistance-inductance-capacitance (rlc) resonance,signal integrity,layout,transfer functions,power transmission lines,noise
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