A time-dependent clustering model for non-uniform dielectric breakdown
Electron Devices Meeting, 2013, Pages 15.3.1-15.3.4.
We report a time-dependent clustering model for non-uniform dielectric breakdown. While at high percentiles non-Possion area scaling dominates, the model restores the weakest-link characteristics at low percentiles relevant for reliability projection. Its validity is demonstrated by area scaling and excellent agreement with multiple exper...More
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