Electrical Breakdown Phenomena Involving Material Interfaces

Hjalmarson, H.P.,Zutavern, F.J., Mar, A., Williamson, K.M.

2013 Abstracts IEEE International Conference on Plasma Science (ICOPS)（2013）

引用 1|浏览18

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arresters,electric breakdown,electron-hole recombination,field emission,permittivity,photoconducting switches,thermionic emission,Auger recombination,air dielectric interface,avalanche breakdown,electrical breakdown phenomena,field emission,high dielectric permittivity,hole densities,insulator electrode interface,ion densities,lightning arresters,material interfaces,photoconductive semiconductor switch devices,switch triggering,thermal breakdown,thermionic emission,time resolved electron

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