A built-in BTI monitor for long-term data collection in IBM microprocessors
Reliability Physics Symposium（2013）
摘要
A circuit for long-term measurement of bias temperature instability (BTI) degradation is described. It is an entirely on-chip measurement circuit, which reports measurements periodically with a digital output. Implemented on IBM's z196 Enterprise systems, it can be used to monitor long-term degradation under real-use conditions. Over 500 days worth of ring oscillator degradation data from customer systems are presented. The importance of using a reference oscillator to measure performance degradation in the field, where the supply voltage and temperature can vary dynamically, is shown.
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关键词
measurement systems,microprocessor chips,negative bias temperature instability,oscillators,ibm microprocessors,ibm z196 enterprise systems,bias temperature instability degradation,built-in bti monitor,customer systems,long-term data collection,long-term measurement,on-chip measurement circuit,real-use conditions,reference oscillator,ring oscillator degradation data,bias-temperature instability,on-chip measurement,ring oscillator introduction,time measurement,temperature measurement,degradation
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