Single-Event Upsets and Distributions in Radiation-Hardened Cmos Flip-Flop Logic Chains

Paul E. Dodd,Marty R. Shaneyfelt,Richard S. Flores,James R. Schwank, Thomas A. Hill,Dale McMorrow,Gyorgy Vizkelethy,Scot E. Swanson,Scott M. Dalton

IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2011）

引用 11|浏览5

关键词

Application specific integrated circuits (ASICs),flip-flops,ion radiation effects,radiation effects,radiation hardening,silicon-on-insulator (SOI) technology,single-event effects,single-event transients (SET),single-event upset (SEU),soft error rate

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