Shunt detection and characterization with fluorescent microthermal imaging

E S Marstein,O Haugen,A G Ulyashin,V V Yurchenko, I O Omolo,T H Johansen,A G J Holt

Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference（2006）

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摘要

Defects originating from the solar cell substrate material or created during the solar cell production process can act as parasitic resistances. These defects reduce the performance of solar cells and can in extreme cases cause serious reliability problems in finished solar modules. Some defects will generate heat locally when a bias voltage is applied to the solar cells. Thermal imaging techniques can therefore be used to obtain information about the location, and hence the origin, of such defects. In this work, fluorescent microthermal imaging (FMI) is used to characterize shunted crystalline silicon solar cells. After an introduction to the technique, the suitability of FMI for solar cell diagnostics is demonstrated

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关键词

fluorescence,infrared imaging,reliability,solar cells,crystalline silicon solar cells,fluorescent microthermal imaging,parasitic resistances,shunt detection,solar cell defect characterization,solar cell substrate material,voltage,liquid crystals,optical imaging,energy states,stationary state,production process

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