Efficient test data compression and decompression for system-on-a-chip using internal scan chains and Golomb coding

Munich(2001)

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摘要
We present a data compression method and decompres- sion architecture for testing embeddedcores in a system-on- a-chip (SOC). The proposed approach makes effective use of Golomb coding and the internal scan chains of the core under test, and provides significantly better results than a recent compression method that uses Golomb coding and a separate cyclical scan register (CSR). The use of the inter- nal scan chain for decompression obviates the need for a CSR. In addition, the novel interleaving decompression ar- chitecture allows multiple cores in an SOC to be tested con- currently using a single ATE I/O channel. We demonstrate the effectiveness of the proposed approach by applying it to the ISCAS 89 benchmark circuits.
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关键词
automatic test equipment,automatic testing,computer architecture,data compression,electronic engineering computing,encoding,integrated circuit testing,interleaved codes,ATE,Golomb coding,ISCAS 89 benchmark circuits,concurrent testing,data decompression,decompression architecture,embedded core,interleaving decompression,internal scan chains,multiple cores,system-on-a-chip,test data compression
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