Neutron-Induced Failure Tests of 3300-V Igbts for the Spallation Neutron Source Accelerator

DL Borovina, JT Bradley,M Pieck, RS Przeklasa, TW Hardek,MT Lynch,DE Rees,PJ Tallerico,WA Reass,SA Wender,BE Takala, SC Ruggles

PROCEEDINGS OF THE 2003 PARTICLE ACCELERATOR CONFERENCE, VOLS 1-5（2003）

引用 4|浏览1

关键词

accelerator RF systems,insulated gate bipolar transistors,linear accelerators,neutron sources,switching networks,transformers,1 GeV,1.1 MW,1500 V,20 kHz,3300 V,IGBT,RF transmitters,Spallation Neutron Source linear accelerator,background cosmic ray radiation,converter-modulator stations,critical threshold voltage,failure mechanisms,low-voltage switching network,multiple-klystron load,neutron flux,neutron interactions,neutron-induced failure tests,proton spallation,step-up transformer,waveform components

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要