Comparison of Photocurrent Enhancement and Upset Enhancement in CMOS Devices in a Medium-Energy X-ray Environment

DE BEUTLER,W BEEZHOLD,JS BROWNING,DM FLEETWOOD, NE COUNTS,DP KNOTT,CL FRESHMAN, MP CONNERS

IEEE Transactions on Nuclear Science（1990）

引用 12|浏览2

关键词

Photoconductivity,Clocks,Photonic integrated circuits,Diodes,Steady-state,SRAM chips,Energy measurement,Integrated circuit measurements,Ceramics,Integrated circuit packaging

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