Unifying self-heating and aging simulations with TMI2

Waikit Lee,Kasa Huang, James Liang,Juanyi Chen,Cheng Hsiao,Kewei Su,Chungkai Lin,Minchie Jeng

Simulation of Semiconductor Processes and Devices（2014）

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摘要

In this paper, we discuss how to implement the self heating and aging models with TMI. Various examples about self heating and aging simulations with TMI methodology are shown in this paper. Without trading-off the accuracy, the one with proposed TMI approach for self heating simulations takes much shorter simulation time.

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关键词

mosfet,ageing,semiconductor device models,finfet,tmi methodology,tmi2,tsmc model interface,aging simulations,self heating simulations,reliability,heating,temperature measurement,degradation,data models,aging

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