Flexible Self-Aligned Double-Gate IGZO TFT

Electron Device Letters, IEEE  (2014)

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摘要
In this letter, flexible double-gate (DG) thin-film transistors (TFTs) based on InGaZnO4 and fabricated on free standing plastic foil, using self-alignment (SA) are presented. The usage of transparent indium-tin-oxide instead of opaque metals enables SA of source-, drain-, and top-gate contacts. Hence, all layers, which can cause parasitic capacitances, are structured by SA. Compared with bottom-gate reference TFTs fabricated on the same substrate, DG TFTs exhibit a by 68% increased transconductance and a subthreshold swing as low as 109 mV/dec decade (-37%). The clockwise hysteresis of the DG TFTs is as small as 5 mV. Because of SA, the source/drain to gate overlaps are as small as ≈ 1 μm leading to parasitic overlap capacitances of 5.5 fF μm-1. Therefore a transit frequency of 5.6 MHz is measured on 7.5 μm long transistors. In addition, the flexible devices stay fully operational when bent to a tensile radius of 6 mm.
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ii-vi semiconductors,flexible electronics,gallium compounds,indium compounds,thin film transistors,titanium compounds,wide band gap semiconductors,zinc compounds,dg thin-film transistors,ingazno4,intio,sa,bottom-gate reference tfts,clockwise hysteresis,drain contacts,flexible devices,flexible self-aligned double-gate igzo tft,free standing plastic foil,frequency 5.6 mhz,opaque metals,parasitic capacitances,radius 6 mm,self-alignment,size 7.5 mum,source contacts,subthreshold swing,top-gate contacts,transconductance,transparent indium-tin-oxide,double-gate (dg),indium-gallium-zinc-oxide (igzo),self-alignment (sa),thin-film transistor (tft),logic gates,resists
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