19.5 Three-dimensional 128Gb MLC vertical NAND Flash-memory with 24-WL stacked layers and 50MB/s high-speed programming

Solid-State Circuits Conference Digest of Technical Papers(2014)

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摘要
In the past few years, various 3D NAND Flash memories have been demonstrated, from device feasibility to chip implementation, to overcome scaling challenges in conventional planar NAND Flash [1-3]. The difficulties include shrinking the NAND cell and increasing manufacturing costs due to quadruple patterning and extreme ultraviolet lithography, motivating the development of the next-generation node beyond 16nm-class NAND Flash [4]. In this paper, as a new 3D memory device with lower manufacturing cost and superior device scalability, we present a true 3D 128Gb 2b/cell vertical-NAND (V-NAND) Flash. The chip accomplishes 50MB/s write throughput with 3K endurance for typical embedded applications such as mobile and personal computer. Also, extended endurance of 35K is achieved with 33MB/s of write throughput for data center and enterprise SSD applications.
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nand circuits,flash memories,three-dimensional integrated circuits,24-wl stacked layers,3d 128gb 2b/cell vertical-nand flash,3d memory device,3k endurance,bit rate 50 mbit/s,data center,embedded applications,enterprise ssd applications,high-speed programming,mobile applications,personal computer,storage capacity 128 gbit,three-dimensional mlc vertical nand flash-memory,write throughput
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