Non-invasive Beam Detection in a High Average Power Electron Accelerator

J. Williams,J. Martinez, J. Van Keuren,J. Harris, S. V. Milton,S. Biedron,S. V. Benson,P. Evtushenko,G. R. Neil,S. Zhang

CLEO 2014（2014）

Cited 1|Views7

Key words

electron accelerators,electron beams,particle beam bunching,particle beam diagnostics,Colorado State University,EO beam diagnostic,Jefferson Laboratory beamline,electron bunch longitudinal emittance,electrooptic detection schemes,high average power electron accelerator,noninvasive beam detection

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