2-D–3-D Switchable Gate Driver Circuit for TFT-LCD Applications

Electron Devices, IEEE Transactions  (2014)

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摘要
This paper presents a novel 2-D-3-D switchable gate driver circuit for active-matrix liquid crystal displays (AMLCDs) applications using the hydrogenated amorphous silicon (a-Si:H) technology. While consisting of 12 thin-film transistors (TFTs), the proposed gate driver circuit includes a pull-up circuit, two alternative circuits, and a key pull-down circuit. To provide a stable output waveform for switching between the 2-D and 3-D modes in AMLCD panel, the proposed circuit can improve the threshold voltage shift of a-Si:H TFT using reversed bias stress. Based on a real circuit integrated on glass with a standard five-mask process applied to a large-sized FHD TFT-LCD panel, the layout area of each gate driver circuit is 359.25 μm × 2296.25 μm. In addition, the power consumption of a 12-stage gate driver circuit is 3.25 and 7.21 mW, while operating at 2-D and 3-D modes, respectively. Measurement results indicate that the output waveform, including output voltage, rising time, and falling time can be stabilized and made almost equal to the initial state after the reliability test at 100 °C over 240 h.
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关键词
amorphous semiconductors,driver circuits,liquid crystal displays,masks,thin film transistors,2d-3d switchable gate driver circuit,amlcd applications,fhd tft-lcd panel,si:h,tft-lcd applications,active-matrix liquid crystal displays,five-mask process,hydrogenated amorphous silicon technology,power 3.25 mw,power 7.21 mw,pull-up circuit,reversed bias stress,size 2296.25 mum,size 359.25 mum,temperature 100 degc,threshold voltage shift,active-matrix liquid crystal displays (amlcds),gate driver circuit,thin-film transistors (tfts),thin-film transistors (tfts).,logic gates,stress,threshold voltage
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