Single-Event Characterization of the 20 Nm Xilinx Kintex UltraScale Field-Programmable Gate Array under Heavy Ion Irradiation

David S. Lee,Gregory R. Allen,Gary Swift,Matthew Cannon,Michael Wirthlin,Jeffrey S. George,Rokutaro Koga, Kangsen Huey

2015 IEEE Radiation Effects Data Workshop (REDW)（2015）

引用 86|浏览10

关键词

Xilinx Kintex ultrascale field-programmable gate array,heavy ion irradiation,single-event response,single-event latch-up,single-event upset,SRAM cells,block RAM memories,FPGA,size 20 nm

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