ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements.

Matteo Meneghini,Simone Vaccari,Matteo Dal Lago,Stefano Marconi,Marco Barbato,Nicola Trivellin,Alessio Griffoni,Alberto Alfier,Giovanni Verzellesi,Gaudenzio Meneghesso,Enrico Zanoni

Microelectronics Reliability（2014）

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摘要

•Analysis of the robustness of RGB LEDs and LED modules submitted to ESD.•Description of the correlation between semiconductor material and ESD failure threshold.•Analysis of the dependence on the failure threshold of the individual LEDs in the chain.

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