Selecting error patters based on symbol reliability for OSD algorithm
Proceedings of the 2010 2nd International Conference on Future Computer and Communication, ICFCC 2010（2010）
摘要
A new scheme of selecting error pattern is proposed. OSD algorithm processes certain MRIPs of a received sequence, performs bits flip among MRIPs, forms error patterns, and then generates candidate codeword. The bits flip is equal probability among MRIPs in OSD algorithms, which leads to too many candidates generated, and seriously affects the implement of algorithm. This paper proposes an improved algorithm which adopts unequal probability strategy utilizing the reliability of received symbols. The simulation results show that the proposed algorithm is effective. With little performance degradation, the computational complexity of algorithm can be reduced by 60% or more for one class of LDPC codes. ©2010 IEEE.
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关键词
error pattern,most reliable independent positions (mrips),ordered statistic decoding (osd),probability,ldpc code,computational complexity,ldpc codes,reliability engineering,statistics,reliability,correlation,block codes,computational modeling,order statistic,decoding,degradation,statistical analysis
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