Nanostructure study of TiO2 films prepared by dip coating process

S. M. Attia,Jue Wang,Guangming Wu,Jun Shen,Jianhua Ma

JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY（2009）

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摘要

The microstructure properties of the sol-gel derived TiO2 films were studied by the atomic force microscopy (AFM). The films were prepared by dip coating process. The optical properties of the films were explained on the basis of the microstructure of the films.

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关键词

atomic force microscopy,TiO2 thin film,sol-gel process

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