Recoverable unstable phenomena in PLED
Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors(2000)
摘要
A recoverable negative resistance phenomenon and short-term degradation in polymer light emitting diode (PLED) were investigated. When the bias on the PLED is higher than a certain voltage, an abrupt change will take place in the current and luminance of PLED. It means that the current and luminance will increase with the decrease of voltage. The negative phenomenon will disappear gradually along with the increase of measurement times. A charge-coupled device (CCD) pick-up camera was used to take images of the abrupt change of luminance. It was found that the change of luminance corresponds to that of current. The short-term degradations of luminance under different polar bias were also studied and the negative bias mode is proved that it can restrain the degradation of luminance. The reason for the recoverable unstable phenomena relates to the defects in PLED and the filling behavior of carriers in it.
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