Single-Frequency Admittance Spectroscopy Measurement Of Band-Offset In A Si Si1-Xgex Si Quantum-Well

A single-frequency admittance spectroscopy technique is presented to determine the band discontinuity of the Si/Si1-xGex/Si single quantum well. The accuracy of determining the activation energy for thermionic emission of holes over the Si barrier is improved as compared with the multiple-frequency admittance spectroscopy measurement. To derive the band offset from the activation energy, the Fermi energy with respect to the band edge is calculated more exactly by solving the Poisson equation which accounts for the carrier transfer at the heterointerface. The accuracy of this technique is verified by the reconstruction of the temperature dependence of capacitance and conductance by the computer simulation.