Calculation Of Discrepancies In Measured Valence Band Offsets Of Heterojunctions With Different Crystal Polarities

The discrepancies in measured valence band offsets (VBOs) of wurtzite III-nitride and II-oxide heterojunctions with different crystal polarities are investigated. The uncertainties of measured VBOs are mainly attributed to the polarization-induced interface charges. Based on the self-consist calculation, we could obtain the discrepancies in VBOs of heterojunctions with different crystal orientations. Mixed polarity has also been considered to explain the differences in the measured VBOs of heterojunctions with the same crystal orientation. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4768707]