Profile measurement of ion temperature and toroidal rotation velocity with charge exchange recombination spectroscopy diagnostics in the HL-2A tokamak

This paper deals with the profile measurement of impurity ion temperature and toroidal rotation velocity that can be achieved by using the charge exchange recombination spectrum (CXRS) diagnostics tool built on the HL-2A tokamak. By using CXRS, an accurate impurity ion temperature and toroidal plasma rotation velocity profile can be achieved under the condition of neutral beam injection (NBI) heating. Considering the edge effect of the line of CVI 529.06 nm (n = 8 similar to 17), which contains three lines (active exciting spectral line (ACX), passivity exciting spectral line (PCX) and electron exciting spectral line (ICE)), and using three Gaussian fitted curves, we obtain the following experimental results: the core ion temperature of HL-2A device is nearly thousands of eV, and the plasma rotation velocity reaches about 104 m.s (1). At the end of paper, some explanations are presented for the relationship between the curves and the inner physical mechanism.