Measurement of complex permittivity of thin substrates using the TE01n resonant cavity

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS（2004）

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摘要

An improved TEOIn resonant-cavity method for measuring the complex permittivity of thin substrates is presented. The theory and the experimental results are described in this paper. (C) 2004 Wiley Periodicals, Inc.

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thin substrate,dielectric,complex permittivity,measurement,TE01n resonant cavity

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