On Voltage Acceleration Models of Time to Breakdown—Part I: Experimental and Analysis Methodologies
IEEE Transactions on Electron Devices(2009)
摘要
We propose and outline three independent experimental methodologies applicable to the investigation of voltage acceleration models of time to breakdown (T BD) for dielectric breakdown. The self-consistence requirement of voltage acceleration models and Poisson random statistics in terms of area scaling is discussed in detail. Three different T BD acceleration models, which are T BD exponential law...
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关键词
Acceleration,Voltage measurement,Stress,Breakdown voltage,Electric breakdown,Tunneling,Logic gates
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