On Voltage Acceleration Models of Time to Breakdown—Part I: Experimental and Analysis Methodologies

IEEE Transactions on Electron Devices(2009)

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摘要
We propose and outline three independent experimental methodologies applicable to the investigation of voltage acceleration models of time to breakdown (T BD) for dielectric breakdown. The self-consistence requirement of voltage acceleration models and Poisson random statistics in terms of area scaling is discussed in detail. Three different T BD acceleration models, which are T BD exponential law...
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关键词
Acceleration,Voltage measurement,Stress,Breakdown voltage,Electric breakdown,Tunneling,Logic gates
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