Efficient error detection in Double Error Correction BCH codes for memory applications.

Microelectronics Reliability(2012)

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摘要
To prevent soft errors from causing data corruption, memories are commonly protected with Error Correction Codes (ECCs). To minimize the impact of the ECC on memory complexity simple codes are commonly used. For example, Single Error Correction (SEC) codes, like Hamming codes are widely used. Power consumption can be reduced by first checking if the word has errors and then perform the rest of the decoding only when there are errors. This greatly reduces the average power consumption as most words will have no errors. In this paper an efficient error detection scheme for Double Error Correction (DEC) Bose–Chaudhuri–Hocquenghem (BCH) codes is presented. The scheme reduces the dynamic power consumption so that it is the same that for error detection in a SEC Hamming code.
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