A Memory Built-In Self-Diagnosis Design With Syndrome Compression

We present a memory built-in self-diagnosis (BISD) design that incorporates a fault syndrome compression scheme. We also have developed efficient faulty-word, faulty-row, and faulty-column identification methods, which have been incorporated in our new BISD design. Our approach reduces the amount of data that need to be transmitted from the chip under test to the automatic test equipment (ATE). It therefore reduces the ATE occupation time and the required ATE capture memory space. It also simplifies the analysis that has to be performed on the ATE. Simulation results for memories under various fault pattern distributions show that in most cases the data can be compressed to less than 6% of its original size.