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Test Circuits for Fast and Reliable Assessment of CDM Robustness of I/O Stages

W Stadler,K Esmark,K Reynders,M Zubeidat,M Graf,W Wilkening,J Willemen,N Qu,S Mettler,M Etherton,D Nuernbergk,H Wolf,H Gieser,W Soppa,V De Heyn,M Natarajan,G Groeseneken,E Morena,R Stella,A Andreini,M Litzenberger,D Pogany,E Gornik,C Foss,A Konrad,M Frank

Microelectronics Reliability（2004）

Cited 18|Views13
Key words
charge-coupled devices,circuit testing,light interferometry,CDM robustness,HBM,I/O stages,backside laser interferometry,charged device model,test circuits,vf-TLP tests
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