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Precision Measurement of R=σL/σT and F2 in Deep Inelastic Electron Scattering

A. Bodek,S. Dasu,R.C. Walker,L.W. Whitlow,J. Alster,R. Arnold,P. de Barbaro,P. Bosted,D. Benton,J. Button-Shafer,G. deChambrier,L. Clogher,B. Debebe,F. Dietrich,B. Filippone,R. Gearhart,H. Harada,R.S. Hicks,J. Jourdan,M.W. Krasny

Nuclear Physics B - Proceedings Supplements（1989）

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关键词
Resonant Inelastic Scattering,Small-Angle Scattering,Secondary Electron Emission,Spectroscopy,Neutron Activation Analysis
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