Nonvolatile memristor memory: Device characteristics and design implications.

ICCAD '09: The International Conference on Computer-Aided Design San Jose California November, 2009(2009)

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摘要
The search for new nonvolatile universal memories is propelled by the need for pushing power-efficient nanocomputing to the next higher level. As a potential contender for the next-generation memory technology of choice, the recently found "the missing fourth circuit element", memristor, has drawn a great deal of research interests. In this paper, we characterize the fundamental electrical properties of memristor devices by encapsulating them into a set of compact closed-form expressions. Our derivations provide valuable design insights and allow a deeper understanding of key design implications of memristor-based memories. In particular, we investigate the design of read and write circuits and analyze data integrity and noise-tolerance issues.
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关键词
electric properties,memristors,radiation hardening (electronics),semiconductor storage,closed-form expressions,memristor device electrical properties,nonvolatile memristor memory,nonvolatile universal memory,
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