Oscillation and Sequential Behavior Caused by Interconnect Opens in Digital CMOS Circuits

ITC（1997）

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摘要

Shorts and opens are the most common types of defects in today's CMOS ICs. In this paper we show forthe first time that an open in the interconnect wiringof a digital CMOS circuit can cause oscillation or sequential behavior. We also analyze and compare thefactors affecting the probabilities for an interconnectopen and a feedback bridging fault to oscillate or display sequential behavior.

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关键词

cmos ics,common type,sequential behavior,interconnect opens,digital cmos circuit,digital cmos circuits,oscillations,capacitance,probabilities

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