Investigation of the frequency dispersion effect in the Root-model applied to conventional and floating-gate MESFETs

This paper investigates measurement and modeling aspects of frequency dispersion effects for GaAs MESFETs. The well-known Root-model's ability to simulate frequency dispersion is evaluated versus measurements. We propose an alternative frequency weighting function that can easily be implemented in the MDS-system. We also investigate the validity of this approach for "floating-gate" MESFETs and pre...